Park Systems

𝗪𝗵𝘆 𝗱𝗼𝗲𝘀 𝗰𝗼𝗻𝘃𝗲𝗻𝘁𝗶𝗼𝗻𝗮𝗹 𝗲𝗹𝗹𝗶𝗽𝘀𝗼𝗺𝗲𝘁𝗿𝘆 𝘀𝘁𝗿𝘂𝗴𝗴𝗹𝗲 𝘄𝗶𝘁𝗵 𝗰𝗼𝗺𝗽𝗹𝗲𝘅 𝗺𝗮𝘁𝗲𝗿𝗶𝗮𝗹𝘀? In a recent interview, 𝗔𝗿𝗮𝘀𝗵 𝗠𝗶𝗿𝗵𝗮𝗺𝗲𝗱, 𝗟𝗲𝗮𝗱 𝗼𝗳 𝘁𝗵𝗲 𝗜𝗦𝗘 𝗦𝘂𝗽𝗽𝗼𝗿𝘁 𝗧𝗲𝗮𝗺 𝗮𝘁 𝗣𝗮𝗿𝗸 𝗦𝘆𝘀𝘁𝗲𝗺𝘀, explains how 𝗜𝗺𝗮𝗴𝗶𝗻𝗴 𝗦𝗽𝗲𝗰𝘁𝗿𝗼𝘀𝗰𝗼𝗽𝗶𝗰 𝗘𝗹𝗹𝗶𝗽𝘀𝗼𝗺𝗲𝘁𝗿𝘆 (𝗜𝗦𝗘) overcomes the limitations of traditional spot-based ellipsometry.   Unlike conventional methods that average measurements over a single spot, 𝗜𝗦𝗘 𝗿𝗲𝗰𝗼𝗿𝗱𝘀 𝘀𝗽𝗮𝘁𝗶𝗮𝗹𝗹𝘆 𝗿𝗲𝘀𝗼𝗹𝘃𝗲𝗱 𝗲𝗹𝗹𝗶𝗽𝘀𝗼𝗺𝗲𝘁𝗿𝗶𝗰 𝗶𝗺𝗮𝗴𝗲𝘀, enabling: ✅ Spatially resolved thickness and optical constant (n/k) mapping ✅ Accurate analysis of patterned or heterogeneous samples ✅ Reduced model ambiguity for complex materials ✅ Faster characterization of large device areas   From 𝟮𝗗 𝗺𝗮𝘁𝗲𝗿𝗶𝗮𝗹𝘀 𝗮𝗻𝗱 𝗦𝗢𝗜 𝘀𝘁𝗿𝘂𝗰𝘁𝘂𝗿𝗲𝘀 𝘁𝗼 𝗯𝗶𝗼𝘀𝗲𝗻𝘀𝗼𝗿𝘀, spatially resolved ellipsometry is becoming essential for advanced thin-film characterization. 💡 “ISE allows researchers to view samples with ellipsometric eyes — revealing even sub-nanometer variations directly in the image.” Read the full interview to learn how ISE bridges the gap between microscopy and traditional ellipsometry. 🔗Full interview >> okt.to/P5TCSX

@billi_blue Exactly!

@Park_Systems What do you mean by automated? The tip lowered and adjusted automatically?

Park Systems has developed automated AFMs that are now widely used in the fields of semiconductors, life science, and materials science. We provide the most advanced nanoscale techniques to science and industry! Want to hear from us on regular basis? 👉Subscribe to our newsletter

[📢Final Call] 𝗔𝗿𝗲 𝘆𝗼𝘂𝗿 𝗳𝗲𝗿𝗿𝗼𝗲𝗹𝗲𝗰𝘁𝗿𝗶𝗰 𝗔𝗙𝗠 𝗿𝗲𝘀𝘂𝗹𝘁𝘀 𝗵𝗮𝗿𝗱 𝘁𝗼 𝗿𝗲𝗽𝗿𝗼𝗱𝘂𝗰𝗲 𝗮𝗰𝗿𝗼𝘀𝘀 𝘀𝗮𝗺𝗽𝗹𝗲𝘀 𝗮𝗻𝗱 𝘂𝘀𝗲𝗿𝘀? This webinar covers AFM automation for standardized nanoscale workflows, including HD-KPFM and DFRT-PFM, plus case studies on layered hBN and CuInP₂S6. Save your seat on March 25th! 👉𝗥𝗲𝗴𝗶𝘀𝘁𝗲𝗿: okt.to/Lg7WbU #webinar #AFM #Ferroelectrics #KPFM #PFM #2Dmaterials #Nanoelectronics

𝗦𝘁𝗶𝗹𝗹 𝘃𝗶𝗯𝗿𝗮𝘁𝗶𝗻𝗴, 𝗼𝗿 𝗮𝗹𝗿𝗲𝗮𝗱𝘆 𝗶𝘀𝗼𝗹𝗮𝘁𝗶𝗻𝗴? DPG Spring Meting in Germany last week showed exactly why stable measurement conditions matter. Even on a shaky wooden exhibition floor, our flagship 𝗶𝟰 𝗔𝗩𝗜 delivers the kind of vibration isolation high-resolution metrology demands. With 𝗮𝗰𝘁𝗶𝘃𝗲 𝗶𝘀𝗼𝗹𝗮𝘁𝗶𝗼𝗻 𝗶𝗻 𝟲 𝗱𝗲𝗴𝗿𝗲𝗲𝘀 𝗼𝗳 𝗳𝗿𝗲𝗲𝗱𝗼𝗺, performance starting at 𝟬.𝟲 𝗛𝘇, up to -𝟰𝟬 𝗱𝗕 𝗮𝘁 𝟭𝟬 𝗛𝘇, and a 𝟬.𝟯 𝘀 𝘀𝗲𝘁𝘁𝗹𝗶𝗻𝗴 𝘁𝗶𝗺𝗲, i4 keeps microscopes and surface metrology systems focused on the sample, not the surroundings. For academia and industry alike: when precision matters, isolate actively. 💡Learn more about the 𝗔𝗰𝗰𝘂𝗿𝗶𝗼𝗻 𝗶𝟰, the state-of-the-art active vibration isolation system for isolating high-resolution measurement equipment: okt.to/bqs6W5 #DPG #Metrology #VibrationIsolation #ActiveVibrationIsolation #MaterialsCharacterization #SemiconductorMetrology #HighResolutionMeasurement #Nanometrology #AVI #AccurionI4

Atomic Force Microscopy (AFM) enables 𝗵𝗶𝗴𝗵-𝗿𝗲𝘀𝗼𝗹𝘂𝘁𝗶𝗼𝗻 𝗶𝗺𝗮𝗴𝗶𝗻𝗴 𝗼𝗳 𝟮𝗗 𝗺𝗮𝘁𝗲𝗿𝗶𝗮𝗹𝘀. In MoS₂ image here, captured via Park #FX200 AFM, the hexagonal arrangement of molybdenum and sulfur atoms creates periodic lateral force changes that the AFM tip senses as torsional deflections. This allows for direct visualization of the atomic lattice structure, providing insight into crystallinity, lattice orientation, and surface defects at the atomic scale—critical for 2D materials research and device development. 💡𝗟𝗲𝗮𝗿𝗻 𝗺𝗼𝗿𝗲 𝗮𝗯𝗼𝘂𝘁 𝗮𝘁𝗼𝗺𝗶𝗰-𝘀𝗰𝗮𝗹𝗲 𝗶𝗺𝗮𝗴𝗶𝗻𝗴 𝘄𝗶𝘁𝗵 𝗣𝗮𝗿𝗸 𝗙𝗫𝟮𝟬𝟬 𝗔𝗙𝗠: okt.to/KGscy0

Are you looking for a flexible nanoscale characterization solution for advanced materials research and failure analysis? Discover how the 𝗣𝗮𝗿𝗸 𝗙𝗫𝟮𝟬𝟬 𝗔𝗙𝗠, the latest generation of atomic force microscope, simplifies the process of capturing nanoscale sample properties. With multifield-view optics, seamless switching between high-performance electrical modes, a fully automated XY stage that supports samples up to 200 mm, and integrated pattern recognition, the FX200 AFM provides access to nanoscale insights in material characterization, making it accessible for researchers with varying levels of experience. 🔎𝗥𝗲𝗾𝘂𝗲𝘀𝘁 𝗮 𝗱𝗲𝗺𝗼: okt.to/v5GHW0 #FX200 #LargeSampleAFM #FailureAnalysis #materialsscience #automation #highperformance

What an exciting start to the AFM Workshop season in India! On March 13, Park Systems India hosted 𝗔𝗙𝗠 𝗳𝗼𝗿 𝗡𝗮𝗻𝗼𝗺𝗮𝘁𝗲𝗿𝗶𝗮𝗹𝘀 𝟮𝟬𝟮𝟲 at 𝗦𝗵𝗶𝘃𝗮𝗷𝗶 𝗨𝗻𝗶𝘃𝗲𝗿𝘀𝗶𝘁𝘆, 𝗞𝗼𝗹𝗵𝗮𝗽𝘂𝗿, bringing together passionate researchers for a day full of ideas, discovery, and hands-on learning. From the latest AFM trends to live demos of the Park NX10 AFM and discussions on correlative research and nanomechanical techniques, the energy in the room was fantastic. A big thank you to 𝗨𝗦𝗜𝗖-𝗖𝗙𝗖, 𝗦𝗵𝗶𝘃𝗮𝗷𝗶 𝗨𝗻𝗶𝘃𝗲𝗿𝘀𝗶𝘁𝘆 for hosting us and to everyone who joined, asked questions, and made the workshop so engaging. #AFM #AtomicForceMicroscopy #NX10AFM #Nanomaterials #MaterialScience #Nanotechnology #ResearchInIndia #MakeInIndia

Characterizing 𝗯𝗶𝗮𝘀𝗲𝗱 𝟮𝗗 𝗱𝗲𝘃𝗶𝗰𝗲𝘀 at the nanoscale requires more than imaging alone. This 𝗮𝗽𝗽𝗹𝗶𝗰𝗮𝘁𝗶𝗼𝗻 𝗻𝗼𝘁𝗲 shows how an 𝗶𝗻𝘁𝗲𝗴𝗿𝗮𝘁𝗲𝗱 𝗺𝘂𝗹𝘁𝗶-𝗽𝗿𝗼𝗯𝗲 𝗔𝗙𝗠 𝗽𝗹𝗮𝘁𝗳𝗼𝗿𝗺 combines advanced AFM modes with simultaneous biased multi-electrode probing for 𝗲𝗹𝗲𝗰𝘁𝗿𝗶𝗰𝗮𝗹 𝗮𝗻𝗱 𝘁𝗵𝗲𝗿𝗺𝗮𝗹 𝗰𝗵𝗮𝗿𝗮𝗰𝘁𝗲𝗿𝗶𝘇𝗮𝘁𝗶𝗼𝗻, 𝗮𝗹𝗹 𝘄𝗶𝘁𝗵𝗶𝗻 𝗼𝗻𝗲 𝘀𝘆𝘀𝘁𝗲𝗺. A key advantage: up to four probes can be used inside a single AFM without mechanical interference, enabling stable in situ transport measurements on nanoscale devices. Explore how this workflow supports 2D materials, nanoelectronics, and semiconductor research. 📜𝗥𝗲𝗮𝗱 𝗵𝗲𝗿𝗲: okt.to/AuQvWz Images below highlight contact-enabled HD-KPFM, current mapping, and moiré mapping on FLG and hBN/FLG heterostructures, showing how in situ transport measurements can support more reliable 2D device analysis. #AFM #2DMaterials #Nanoelectronics #Nanometrology #KPFM #Semiconductor

Greetings from the #𝗗𝗣𝗚 𝗦𝗽𝗿𝗶𝗻𝗴 𝗠𝗲𝗲𝘁𝗶𝗻𝗴 𝗶𝗻 𝗗𝗿𝗲𝘀𝗱𝗲𝗻, one of Europe’s leading annual physics conferences. Join us at booths A21 and A33 for live demonstrations of advanced tools for precision research: 👉𝗙𝗫𝟰𝟬 𝗔𝘂𝘁𝗼𝗺𝗮𝘁𝗶𝗰 𝗔𝗙𝗠 for high-precision research on small samples 👉𝗥𝗲𝗳𝗹𝗲𝗰𝘁𝗶𝗼𝗻 𝗗𝗶𝗴𝗶𝘁𝗮𝗹 𝗛𝗼𝗹𝗼𝗴𝗿𝗮𝗽𝗵𝗶𝗰 𝗠𝗶𝗰𝗿𝗼𝘀𝗰𝗼𝗽𝗲 (𝗗𝗛𝗠)  for accurate optical topography on a wide variety of samples 👉𝗔𝗰𝗰𝘂𝗿𝗶𝗼𝗻 𝗶𝟰 active vibration isolation system for stable, high-quality measurements Come speak with our team about your research needs, see the systems in action, and discover how our solutions can support your experiments and deliver publication-ready data. We are here until Thursday afternoon (March 12). See you in Dresden!

𝗦𝘁𝗶𝗹𝗹 𝘀𝘄𝗶𝘁𝗰𝗵𝗶𝗻𝗴 𝗽𝗿𝗼𝗯𝗲𝘀 𝗮𝗻𝗱 𝗺𝗼𝗱𝗲𝘀 𝗯𝘆 𝗵𝗮𝗻𝗱 𝘁𝗼 𝗺𝗮𝗽 𝗳𝗲𝗿𝗿𝗼𝗲𝗹𝗲𝗰𝘁𝗿𝗶𝗰 𝗱𝗼𝗺𝗮𝗶𝗻𝘀 𝗶𝗻 𝟮𝗗 𝘀𝘁𝗮𝗰𝗸𝘀? Join Park Systems’ 𝗹𝗶𝘃𝗲 𝘄𝗲𝗯𝗶𝗻𝗮𝗿 on AFM automation for ferroelectric materials and superlattices. Learn how automated electrical AFM workflows enable reproducible HD-KPFM and DFRT-PFM without manual reconfiguration, delivering publication-quality nanoscale data. Featuring real case studies on parallel stacked hBN and CuInP₂S6 flakes, including automated probe exchange and mode switching for the optimal setup every time. 👉𝗥𝗲𝗴𝗶𝘀𝘁𝗲𝗿: okt.to/WFmQvg   💡What ferroelectric system are you characterizing next? #AFM #Ferroelectrics #KPFM #PFM #2Dmaterials #Nanoelectronics #Sensors #ElectroOptics #Capacitors

𝗘𝗹𝗲𝗰𝘁𝗿𝗶𝗳𝗶𝗲𝗱 𝗯𝘆 𝗔𝗙𝗠: 𝗘𝗮𝘀𝗲-𝗼𝗳-𝘂𝘀𝗲 𝗪𝗲𝗲𝗸 / 𝗕𝗼𝗻𝘂𝘀 𝗘𝗽𝗶𝘀𝗼𝗱𝗲]​ ​In this video we show how Park Systems’ FX series AFMs can be used to map the topography and contact potential difference of a marginally twisted (~0 degrees) bilayer graphene on hBN using Kelvin probe force microscopy (KPFM) before switching to conductive AFM to measure moiré patterns. The ability of the FX series to change the electrical configuration of the AFM for conductive and KPFM means 𝘁𝗵𝗲𝘀𝗲 𝗲𝘅𝗽𝗲𝗿𝗶𝗺𝗲𝗻𝘁𝘀 𝗰𝗮𝗻 𝗯𝗲 𝗽𝗲𝗿𝗳𝗼𝗿𝗺𝗲𝗱 𝗮𝘂𝘁𝗼𝗺𝗮𝘁𝗶𝗰𝗮𝗹𝗹𝘆 𝗮𝗻𝗱 𝘄𝗶𝘁𝗵 𝗻𝗼 𝗻𝗲𝗲𝗱 𝘁𝗼 𝗺𝗮𝗻𝘂𝗮𝗹𝗹𝘆 𝗿𝗲𝗰𝗼𝗻𝗳𝗶𝗴𝘂𝗿𝗲 𝗵𝗮𝗿𝗱𝘄𝗮𝗿𝗲 𝗮𝗻𝗱 𝗹𝗼𝘀𝗲 𝘆𝗼𝘂𝗿 𝗹𝗼𝗰𝗮𝘁𝗶𝗼𝗻 𝗼𝗻 𝘁𝗵𝗲 𝘀𝗮𝗺𝗽𝗹𝗲! ​ ​ 💡𝗙𝗶𝗻𝗱 𝗼𝘂𝘁 𝗺𝗼𝗿𝗲 𝗮𝗯𝗼𝘂𝘁 𝗵𝗼𝘄 𝗼𝘂𝗿 𝗙𝗫 𝘀𝗲𝗿𝗶𝗲𝘀 𝗶𝗻𝘀𝘁𝗿𝘂𝗺𝗲𝗻𝘁𝘀 𝗺𝗮𝗸𝗲 𝗔𝗙𝗠 𝗲𝗮𝘀𝘆: okt.to/D7FrpK     ​ ​ Caption: In this video we switch between KPFM and C-AFM on marginally (~0 degrees) twisted bilayer graphene on hBN using our FX200 automatic AFM.

This 𝗜𝗻𝘁𝗲𝗿𝗻𝗮𝘁𝗶𝗼𝗻𝗮𝗹 𝗪𝗼𝗺𝗲𝗻’𝘀 𝗗𝗮𝘆🎉, we would like to celebrate the brilliant women in science whose discoveries changed how we understand the world and continue to power innovation: from radioactivity and genetics to CRISPR, mRNA, astrophysics and beyond. Their groundbreaking work, recognized by prizes such as the Nobel Prize, has opened new paths for research, technology and human progress👏👏👏. At Park Systems, we are proud to support women across science and technical roles every day, and to champion the talent, curiosity and leadership that move innovation forward. #IWD #WomenInScience #Innovation

𝗜𝗖𝗔𝗠 𝟮𝟬𝟮𝟲 in Vietnam has wrapped up, bringing together a highly engaged international materials and nanoscience community. 💡Did you know that Vietnam is increasingly relevant to global nanoresearch trends? Its fast-growing research ecosystem, expanding university and lab capacity, and stronger links between academia and industry make it a practical place to build cross-border projects, share instrumentation know-how, and accelerate translation from experiments to applications. 𝗧𝗵𝗮𝗻𝗸 𝘆𝗼𝘂 𝘁𝗼 𝗲𝘃𝗲𝗿𝘆𝗼𝗻𝗲 𝘄𝗵𝗼 𝘃𝗶𝘀𝗶𝘁𝗲𝗱 𝘁𝗵𝗲 𝗣𝗮𝗿𝗸 𝗦𝘆𝘀𝘁𝗲𝗺𝘀 𝗯𝗼𝗼𝘁𝗵! We appreciated the focused discussions on measurement challenges, reproducibility, and next-step collaborations across nanotechnology and advanced materials.

𝗘𝗹𝗲𝗰𝘁𝗿𝗶𝗳𝗶𝗲𝗱 𝗯𝘆 𝗔𝗙𝗠: 𝗘𝗮𝘀𝗲-𝗼𝗳-𝘂𝘀𝗲 𝗪𝗲𝗲𝗸 / 𝗘𝗽𝗶𝘀𝗼𝗱𝗲 𝟱]​ ​In this video we showcase how Park Systems’ FX series AFMs can be 𝗲𝗮𝘀𝗶𝗹𝘆 𝗿𝗲𝗰𝗼𝗻𝗳𝗶𝗴𝘂𝗿𝗲𝗱 𝗯𝗲𝘁𝘄𝗲𝗲𝗻 𝗰𝗼𝗻𝗱𝘂𝗰𝘁𝗶𝘃𝗲 𝗔𝗙𝗠 (𝗖-𝗔𝗙𝗠) 𝗮𝗻𝗱 𝗼𝘁𝗵𝗲𝗿 𝗲𝗹𝗲𝗰𝘁𝗿𝗶𝗰𝗮𝗹 𝗺𝗼𝗱𝗲𝘀 such as Kelvin probe force microscopy (KPFM).​ The FX series can 𝗮𝘂𝘁𝗼𝗺𝗮𝘁𝗶𝗰𝗮𝗹𝗹𝘆 𝘀𝘄𝗶𝘁𝗰𝗵 𝘁𝗵𝗲 𝗰𝗶𝗿𝗰𝘂𝗶𝘁𝘀 𝘁𝗵𝗲 𝘁𝗶𝗽 𝗶𝘀 𝗰𝗼𝗻𝗻𝗲𝗰𝘁𝗲𝗱 𝘁𝗼. For example, in C-AFM the tip is connected to a current amplifier. This removes the need to touch the instrument when changing modes and makes correlative measurements much simpler.​ In this example, we switch between KPFM and C-AFM while scanning a cobalt doped iron oxide thin film.​ ​ 💡𝗙𝗶𝗻𝗱 𝗼𝘂𝘁 𝗺𝗼𝗿𝗲 𝗮𝗯𝗼𝘂𝘁 𝗵𝗼𝘄 𝗼𝘂𝗿 𝗙𝗫 𝘀𝗲𝗿𝗶𝗲𝘀 𝗶𝗻𝘀𝘁𝗿𝘂𝗺𝗲𝗻𝘁𝘀 𝗺𝗮𝗸𝗲 𝗔𝗙𝗠 𝗲𝗮𝘀𝘆 𝗵𝗲𝗿𝗲: okt.to/lXYVHZ     ​ ​ 𝗖𝗮𝗽𝘁𝗶𝗼𝗻: In this video we switch between KPFM and C-AFM on a cobalt doped iron oxide thin film, all without touching the hardware of the FX200 AFM.​ ​ #easeofuse #automation #AFM #FXAFMs

𝗘𝗹𝗲𝗰𝘁𝗿𝗶𝗳𝗶𝗲𝗱 𝗯𝘆 𝗔𝗙𝗠: 𝗘𝗮𝘀𝗲-𝗼𝗳-𝘂𝘀𝗲 𝗪𝗲𝗲𝗸 / 𝗘𝗽𝗶𝘀𝗼𝗱𝗲 𝟰]​ ​Advanced electrical imaging in just a few clicks!​ ​In this video we showcase how Park Systems FX series AFMs can be 𝗲𝗮𝘀𝗶𝗹𝘆 𝗰𝗼𝗻𝗳𝗶𝗴𝘂𝗿𝗲𝗱 𝗳𝗼𝗿 𝘄𝗼𝗿𝗸 𝗳𝘂𝗻𝗰𝘁𝗶𝗼𝗻 𝗮𝗻𝗱 𝘀𝘂𝗿𝗳𝗮𝗰𝗲 𝗽𝗼𝘁𝗲𝗻𝘁𝗶𝗮𝗹 𝗺𝗲𝗮𝘀𝘂𝗿𝗲𝗺𝗲𝗻𝘁𝘀 𝘂𝘀𝗶𝗻𝗴 𝗞𝗲𝗹𝘃𝗶𝗻 𝗽𝗿𝗼𝗯𝗲 𝗳𝗼𝗿𝗰𝗲 𝗺𝗶𝗰𝗿𝗼𝘀𝗰𝗼𝗽𝘆 (𝗞𝗣𝗙𝗠). All FX series AFMs come ready for 𝗵𝗲𝘁𝗲𝗿𝗼𝗱𝘆𝗻𝗲 (𝗛𝗗-)𝗞𝗣𝗙𝗠 (included in the standard configuration). Setting up this measurement takes seconds with our automated setup.​ ​  In this example, we scan 𝗳𝗲𝗿𝗿𝗼𝗲𝗹𝗲𝗰𝘁𝗿𝗶𝗰 𝗱𝗼𝗺𝗮𝗶𝗻𝘀 𝗶𝗻 𝗽𝗮𝗿𝗮𝗹𝗹𝗲𝗹 𝘀𝘁𝗮𝗰𝗸𝗲𝗱 𝗵𝗕𝗡 𝗼𝗻 𝗴𝗿𝗮𝗽𝗵𝗲𝗻𝗲. We begin in non-contact mode and choose a reduced field-of-view region before proceeding to set-up and scan using HD-KPFM. ​ ​ 💡𝗙𝗶𝗻𝗱 𝗼𝘂𝘁 𝗺𝗼𝗿𝗲 𝗮𝗯𝗼𝘂𝘁 𝗼𝘂𝗿 𝗵𝗲𝘁𝗲𝗿𝗼𝗱𝘆𝗻𝗲 𝗞𝗣𝗙𝗠 𝗼𝗽𝘁𝗶𝗼𝗻 𝗵𝗲𝗿𝗲: okt.to/mBY2Nd     ​𝗖𝗮𝗽𝘁𝗶𝗼𝗻: In this video we show how HD-KPFM experiments can be set up in seconds with 5 easy steps: 1. Choose to do HD-KPFM in our sample bias tab. ​ 2. Run an automatic heterodyne frequency sweep. ​ 3. Apply a voltage in the lock-in amplifier tab. ​ 4. Choose the KPFM channels. ​ 5. Turn on the KPFM feedback.  #easeofuse #automation #AFM #KPFM #FXAFMs

𝗘𝗹𝗲𝗰𝘁𝗿𝗶𝗳𝗶𝗲𝗱 𝗯𝘆 𝗔𝗙𝗠: 𝗘𝗮𝘀𝗲-𝗼𝗳-𝘂𝘀𝗲 𝗪𝗲𝗲𝗸 / 𝗘𝗽𝗶𝘀𝗼𝗱𝗲 𝟯]​ ​Land safely every time!​ In this video, we show how Park Systems AFMs enable 𝗿𝗲𝗹𝗶𝗮𝗯𝗹𝗲 𝗽𝗿𝗼𝗯𝗲 𝗹𝗮𝗻𝗱𝗶𝗻𝗴 𝗲𝘃𝗲𝗿𝘆 𝘁𝗶𝗺𝗲. We monitor the cantilever dynamics during descent so that the probe can be lowered by several centimeters in seconds. As a result, users do not need to enter any sample height information to land safely.​ ​ 𝗛𝗲𝗿𝗲 𝗮𝗿𝗲 𝗷𝘂𝘀𝘁 𝘀𝗼𝗺𝗲 𝗼𝗳 𝘁𝗵𝗲 𝗮𝗱𝘃𝗮𝗻𝘁𝗮𝗴𝗲𝘀: ​ 💡Reliable and fully automatic landing of the probe no matter the sample height​ 💡No need for users to check sample heights before landing ​ 💡No way for inexperienced users to crash the probe during landing ​ ​ 𝗙𝗶𝗻𝗱 𝗼𝘂𝘁 𝗺𝗼𝗿𝗲 𝗮𝗯𝗼𝘂𝘁 𝗵𝗼𝘄 𝗼𝘂𝗿 𝗙𝗫 𝘀𝗲𝗿𝗶𝗲𝘀 𝗶𝗻𝘀𝘁𝗿𝘂𝗺𝗲𝗻𝘁𝘀 𝗺𝗮𝗸𝗲 𝗔𝗙𝗠 𝗲𝗮𝘀𝘆: okt.to/xs1C5A ​ Caption: We show how a probe is engaged onto the surface with our FX200 AFM. Reliable tracking of the cantilever dynamics over a large height range enables convenient landing with no possibility for user error.  #easeofuse #automation #AFM #FXAFMs

𝗘𝗹𝗲𝗰𝘁𝗿𝗶𝗳𝗶𝗲𝗱 𝗯𝘆 𝗔𝗙𝗠: 𝗘𝗮𝘀𝗲-𝗼𝗳-𝘂𝘀𝗲 𝗪𝗲𝗲𝗸 / 𝗘𝗽𝗶𝘀𝗼𝗱𝗲 𝟮]​ ​Imagine navigating through multiple samples, no knob adjusting, no manual handling, no checking by eye where the sample is - 𝗮𝗹𝗹 𝗺𝗼𝘁𝗼𝗿𝗶𝘇𝗲𝗱 𝗮𝗻𝗱 𝗮𝘂𝘁𝗼𝗺𝗮𝘁𝗲𝗱. Park AFMs make it possible!​ ​ In this video we showcase the sample alignment features of Park Systems’ FX series AFMs. A calibrated alignment camera above the motorized sample stage maps all samples on the chuck and defines locations for automated measurements.​ ​ 𝗛𝗲𝗿𝗲 𝗮𝗿𝗲 𝗷𝘂𝘀𝘁 𝘀𝗼𝗺𝗲 𝗼𝗳 𝘁𝗵𝗲 𝗮𝗱𝘃𝗮𝗻𝘁𝗮𝗴𝗲𝘀: ​ 💡Effortlessly map all samples loaded on the instrument and land safely on the right region every time ​ 💡Mark stage coordinates for later automated measurements​ 💡Easily and safely switch between samples on the wafer chuck remotely with the top-view camera​ ​ 𝗔𝘂𝘁𝗼𝗺𝗮𝘁𝗲𝗱 𝗹𝗶𝗸𝗲 𝗻𝗼 𝗼𝘁𝗵𝗲𝗿 𝗔𝗙𝗠! 𝗖𝘂𝗿𝗶𝗼𝘂𝘀 𝘁𝗼 𝗹𝗲𝗮𝗿𝗻 𝗺𝗼𝗿𝗲? 𝗕𝗿𝗼𝘄𝘀𝗲 𝘁𝗵𝗿𝗼𝘂𝗴𝗵 𝗼𝘂𝗿 𝘀𝗺𝗮𝗹𝗹 𝗮𝗻𝗱 𝗹𝗮𝗿𝗴𝗲 𝘀𝗮𝗺𝗽𝗹𝗲 𝗔𝗙𝗠𝘀 𝗳𝗿𝗼𝗺 𝘁𝗵𝗲 𝗹𝗮𝘁𝗲𝘀𝘁 𝗙𝗫 𝘀𝗲𝗿𝗶𝗲𝘀: okt.to/A0vteH    Caption:​ In this video, we show how to load samples onto the FX200 AFM wafer chuck and optically map the stage for safe, easy remote navigation with the motorised stage. #easeofuse #automation #AFM #FXAFMs

Meet our European team at #𝗗𝗣𝗚𝗦𝗞𝗠 𝟮𝟬𝟮𝟲 𝗶𝗻 𝗗𝗿𝗲𝘀𝗱𝗲𝗻 (𝗧𝗨 𝗗𝗿𝗲𝘀𝗱𝗲𝗻) — Exhibition March 10–12. For the first time, we’ll have two booths: • 𝗔𝟮𝟭 — #𝗔𝗙𝗠 & #𝗗𝗛𝗠: FX40 AFM for high-resolution, quantitative nanoscale measurements + Lyncee Tec DHM for label-free quantitative phase imaging (first time at #DPGSKM). • 𝗔𝟯𝟯 — 𝗔𝗰𝘁𝗶𝘃𝗲 #𝗩𝗶𝗯𝗿𝗮𝘁𝗶𝗼𝗻𝗜𝘀𝗼𝗹𝗮𝘁𝗶𝗼𝗻 (𝗔𝗩𝗜): Stability solutions for vibration-sensitive, high-resolution experiments. 𝗦𝘁𝗼𝗽 𝗯𝘆 𝘁𝗼 𝗱𝗶𝘀𝗰𝘂𝘀𝘀 𝘆𝗼𝘂𝗿 𝗮𝗽𝗽𝗹𝗶𝗰𝗮𝘁𝗶𝗼𝗻—𝗼𝗿 𝗺𝗲𝘀𝘀𝗮𝗴𝗲 𝘂𝘀 𝘁𝗼 𝘀𝗰𝗵𝗲𝗱𝘂𝗹𝗲 𝗮 𝗾𝘂𝗶𝗰𝗸 𝗺𝗲𝗲𝘁𝗶𝗻𝗴. 💡𝗙𝗶𝗻𝗱 𝗼𝘂𝘁 𝗺𝗼𝗿𝗲: okt.to/hGCq9K

𝗘𝗹𝗲𝗰𝘁𝗿𝗶𝗳𝗶𝗲𝗱 𝗯𝘆 𝗔𝗙𝗠: 𝗘𝗮𝘀𝗲-𝗼𝗳-𝘂𝘀𝗲 𝗪𝗲𝗲𝗸 / 𝗘𝗽𝗶𝘀𝗼𝗱𝗲 𝟭]​ ​Use your hands to wave goodbye to manual AFM probe loading and alignment! 👋 👋 👋 ​ ​ Park Systems’ FX series AFMs are f𝘂𝗹𝗹𝘆 𝗺𝗼𝘁𝗼𝗿𝗶𝘇𝗲𝗱, 𝗲𝗻𝗮𝗯𝗹𝗶𝗻𝗴 𝗮𝘂𝘁𝗼𝗺𝗮𝘁𝗶𝗰 𝗽𝗿𝗼𝗯𝗲 𝗹𝗼𝗮𝗱𝗶𝗻𝗴, 𝗲𝘅𝗰𝗵𝗮𝗻𝗴𝗲 𝗮𝗻𝗱 𝗮𝗹𝗶𝗴𝗻𝗺𝗲𝗻𝘁 𝘄𝗶𝘁𝗵𝗼𝘂𝘁 𝘁𝗼𝘂𝗰𝗵𝗶𝗻𝗴 𝘁𝗵𝗲 𝗶𝗻𝘀𝘁𝗿𝘂𝗺𝗲𝗻𝘁. In this video, we show probe loading, QR code recognition, probe pickup, probe detection and alignment – all fully automated. ​ ​ 𝗛𝗲𝗿𝗲 𝗮𝗿𝗲 𝗷𝘂𝘀𝘁 𝘀𝗼𝗺𝗲 𝗼𝗳 𝘁𝗵𝗲 𝗮𝗱𝘃𝗮𝗻𝘁𝗮𝗴𝗲𝘀:  ​ ​ 💡Load multiple probes and switch between them remotely during long automated experiments​ 💡QR codes enable automatic detection of the probe type and a unique serial number for each one​ 💡New users can focus on understanding the technique rather than laborious and delicate alignment protocols ​ 💡Safety features remove the possibility to damage the system by user error ​ ​ 𝗡𝗼 𝗼𝘁𝗵𝗲𝗿 𝗿𝗲𝘀𝗲𝗮𝗿𝗰𝗵 𝗔𝗙𝗠 𝗰𝗮𝗻 𝗱𝗼 𝗶𝘁! 𝗖𝘂𝗿𝗶𝗼𝘂𝘀 𝘁𝗼 𝗹𝗲𝗮𝗿𝗻 𝗺𝗼𝗿𝗲? 𝗕𝗿𝗼𝘄𝘀𝗲 𝘁𝗵𝗿𝗼𝘂𝗴𝗵 𝗼𝘂𝗿 𝘀𝗺𝗮𝗹𝗹 𝗮𝗻𝗱 𝗹𝗮𝗿𝗴𝗲 𝘀𝗮𝗺𝗽𝗹𝗲 𝗔𝗙𝗠𝘀 𝗳𝗿𝗼𝗺 𝘁𝗵𝗲 𝗹𝗮𝘁𝗲𝘀𝘁 𝗙𝗫 𝘀𝗲𝗿𝗶𝗲𝘀: okt.to/UsAxwM    Caption: In this video we show probe loading, QR code recognition, probe pickup, probe detection and alignment by our FX200 AFM.  #easeofuse #automation #AFM #FXAFMs

Semiconductor thin-film metrology and QC need more than spot averages. 𝗘𝗣𝟰 𝗜𝗺𝗮𝗴𝗶𝗻𝗴 𝗦𝗽𝗲𝗰𝘁𝗿𝗼𝘀𝗰𝗼𝗽𝗶𝗰 𝗘𝗹𝗹𝗶𝗽𝘀𝗼𝗺𝗲𝘁𝗲𝗿 delivers 𝗾𝘂𝗮𝗻𝘁𝗶𝘁𝗮𝘁𝗶𝘃𝗲 𝗼𝗽𝘁𝗶𝗰𝗮𝗹 𝗺𝗮𝗽𝗽𝗶𝗻𝗴 𝗼𝗻 𝗽𝗮𝘁𝘁𝗲𝗿𝗻𝗲𝗱 𝘄𝗮𝗳𝗲𝗿𝘀 𝗮𝗻𝗱 𝗺𝗶𝗰𝗿𝗼𝘀𝘁𝗿𝘂𝗰𝘁𝘂𝗿𝗲𝘀. 💡𝗟𝗲𝗮𝗿𝗻 𝗺𝗼𝗿𝗲: okt.to/EP50NF 𝗪𝗵𝘆 𝗘𝗣𝟰 𝗳𝗶𝘁𝘀 𝗳𝗮𝗯 𝗤𝗖 ✅ ~1 µm lateral resolution for patterned devices ✅ Thickness + n,k micro-maps with parallel multi-ROI ✅ 190–2750 nm spectroscopic imaging for diverse stacks ✅ Backside-reflection suppression on transparent substrates ✅ QC-ready OEM option for product lines Which film stack is driving your yield loss? #Semiconductor #ThinFilmMetrology #Ellipsometry #ProcessControl #MEMS #QualityControl